Temperature, Relative Humidity and Voltage Stress combinations on Metallized Films trigger different aging mechanisms and impact the performance of Film Capacitors during application.
K-LEM (KEMET Life Expectancy Model) is a powerful tool able to predict Metallized Film Capacitor service life for series designed to withstand temperature, humidity & voltage (THB).
K-LEM is the first of its kind tool able to take into consideration the Temperature, Relative Humidity and Voltage effect based on a model developed at KEMET from experimental measurements on capacitors.
The Life Expectancies calculated by the Model are a useful tool for designers to model typical behavior of a Film Capacitor based on the mission profile of the appliance or electronic device.
We are developing a K-LEM Web application tool where customers can input the Voltage, ambient temperature, Irms current, frequency & relative humidity for all the conditions related to the mission profile.
The KEMET tool allows a designer to select the part number that bests fit with customer needs and its life expectancy.