Device and Component Modeling
Technical Dialogue Session
Modeling of Components and SiC Devices
Degradation, MLCC aging, EMI simulations, Impedance Characterization, High Frequency Behavior, Modelling, Accelerated Stress Testing, High Voltage
This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.