Power Silicon MOSFETs, BJTs, IGBTs
Technical Dialogue Session
Devices and Components I
Common mode (CM), electromagnetic interference (EMI), Si/SiC hybrid switch, switching patterns
This paper studies the influence of switching patterns on the CM EMI emission of the Si/SiC hybrid switch based half-bridge DC/DC converter. Experimental results demonstrate that the CM EMI emission caused by pattern 1 is smaller than that under pattern 4. However, the total loss of the half-bridge DC/DC converter adopting pattern 1 is larger than that under the pattern 4. Therefore, if the efficiency is not considered, pattern 1 can be adopted, vice versa. In the future, we will analyze the influence of CM EMI generated by all drive patterns.