Technical Lecture Session
Modeling of Magnetic Components and Systems
Flux Cancellation, Half-Bridge, Impedance Analysis, Inductance over Frequency, Mutual Inductance, MCPM, Package Parasitic Model, Power Module
This paper proposes a new measurement-based modeling procedure that addresses both of these challenges with traditional characterization methods. First, it is shown that by gating ON the semiconductors, the series impedance of the semiconductor channel is reduced to its on-state resistance. This dramatically improves the accuracy of the resulting inductance estimates and enables estimation of inductance across frequency. Second, the paper proposes a method to extract the mutual coupling of a half-bridge module. The proposed methodology is applied to the analysis of a discrete SiC MOSFET, as well as a medium voltage SiC MOSFET half-bridge power module.