Integrating LSS Principles, Tools, and Techniques in Quality 4.0
Concurrent Sessions (M09 - M14)
M13 - Perfecting a Failure Analysis Process Through 6σ
Monday, February 24, 2020
10:45 AM – 11:45 AM
Location: Courtroom OP
Presentation Description: Who says that Lean Six Sigma is useful only in manufacturing process?
This paper is a game-changing effort to demonstrate the extended applicability of Lean Six Sigma even for support functions like Failure Analysis and Reliability. Following the DMAIC’s structured problem-solving process, the paper elaborately discussed how the tedious and often inconsistent manual decapsulation process of copper-wired SOIC packages was effectively resolved. The DMAIC-style investigation led to a number of controversial conclusions never before heard of by the failure analysis practitioners. These were instrumental in the development of revolutionary solutions that eventually zeroed out the chronic problem of wrong sample preparation caused by inconsistent manual copper decapsulation.
In a nutshell, the paper not only proved the usefulness of Lean Six Sigma in Failure Analysis, it also demonstrated that perfection can be achieved.
To learn how the Six Sigma tools are effectively used to solve a chronic problem in Failure Analysis
To learn how the statistical tools were effectively used to validate hypothesis
To learn how an existing electro-chemical theory was utilized to come up with a Poka-Yoke solution on etching consistency