Edison, New Jersey
David E. Verbitsky received MS/BS (Physics/Control Systems, Gorky University) and worked with two major electronics companies in USSR. He focused on (prevalent early) failure/defect/nonconformity analysis ((PE)FA) and resolved/prevented/improved numerous serious safety, quality, reliability, improvement, profitability and testing (SQRIPT) problems/features. David also founded advanced FA lab, published/presented ~35 papers and defended exemplary PhD dissertation (Kishinev Polytechnic Institute).
Since 1992, David has worked in USA, resolved/prevented various PEF and improved SQRIPT for Lockheed’s GPS-3; Boeing-787; first digital/GHz and classical AT&T/Lucent telephones; key broadband Si and InGaAs components; health devices, etc. He saved vital contracts and reputations cost-effectively and result-efficiently, elaborated his methodologies and authored ~30 new papers/presentations.
David’s studies span PE failure modes-mechanisms-causes (FMMC) in various circuits, measuring devices, computers, consumer products, communication, data acquisition, control systems and software. He also addressed nonconformities-malfunctions of different PCB, chips, assemblies, packages, joints, connectors, frames, etc. David defined subgroups of deemed uniform total, subtle, hidden, parametric, intermittent, (un)balanced, (ir)relevant, missing, (non)-Arrhenius (PE)FMMCs during fabrication, infant mortality and normal life. David discovered/characterized many typical (extra/super)early (in/ex)trinsic, (in/ex)herent, (ir)reversible, (anisen/isen)tropic, instantaneous and cumulative damages, destructions, degenerations, deficiencies, destabilizations, deteriorations, degradations, drifts, shocks, shifts, unsteadiness, instabilities, their interactions and impacts on (PE)FMMCs (DISX classification adapting conventional arrangements to EF specifics). He optimized/invented several (non)destructive accelerated-process-functional tests, open-circuit troubleshooting, parametric malfunctions’ localization, etc.
David developed original, result-oriented three-stage Systemic Early FA (SEFA) methodology especially effective during mass production. SEFA’s flexible, hierarchical, instrumentation-based approach comprises traditional and original techniques, which dramatically reduce “habitual” and unique PEF waste (joint F10-FTA-FMECA; P7 and DISX classifications; EF-tailored Pareto-Juran rules). David revealed crucial impact of fundamental features vs. conventional “assignable” freaks-faults-fluctuations (F10 concept); essential (PE)SQRIPT ties; proposed enhanced-modernized FRACAS-EM closed feedback-loop and emphasized management assessment-decision/directions-support (MADS) for continuous improvement. David is CQE, Sr. member of ASQ and IEEE, member of SAE.
Tuesday, May 21
9:15 AM – 10:15 AM