Advanced Content Master's Series
Traditional quality approaches to modern electronics and hybrids often rely on expensive and unguaranteed phenomenological methods. They lack subject matter analysis, disregard specific failure modes, overestimate extrinsic and late-life sources, and overlook and/or misattribute prevalent early failure (PEF) caused by intrinsic issues. This creates a misleading picture, high-risk losses, and missing vital opportunities during all stages of the product-project life cycle. The three-step systemic early failure analysis (SEFA) methodology successfully addresses PEF challenges using complementary methods and tools. A proposed enhanced and modernized failure reporting, analysis, corrective-preventive action system (FRACAS-EM) further enhances SEFA efficiency, providing a quality-improvement feedback loop and strong but adaptive organizational frame. A detailed examination of characteristic solder PEF and a brief outline of numerous other cross-industry live PEFs exemplify the matters. Theoretical considerations and practical recommendations lead to diverse, comprehensive, and synergetic improvements.