Risk and Change

Concurrent Session

W02 - ISO/IEC 17025:2017 New Requirements

Wednesday, May 2
8:00 AM - 9:00 AM
Location: WSCC 615-617

Level: Intermediate

Division: Measurement Quality Division

The new revision of the ISO/IEC 17025 standard will be released by the end of the year 2017. The standard has undergone a review and revision process for over two years. The requirements in the standard have been renumbered. The new standard introduces the concepts of risk to the calibration and testing laboratories. Even though risk management through measurement uncertainty estimation has always been a requirement in the current revision of the standard, risk management in other areas will be new to the standard. This session will highlight key points that are new and provide guidance in complying with the changes.

Learning Objectives:

Dilip A. Shah

ASQ Fellow

President
E = mc3 Solutions
Medina, Ohio

Dilip A. Shah is an ASQ Fellow with more than 40 years of industry experience in metrology, electronics, instrumentation, measurement, and computer applications of statistics in the quality assurance areas. He is currently a principal of E = mc3 Solutions, an organization that provides training and consulting solutions in ISO/IEC 17025, ISO/IEC 9001 IATF16949, measurement uncertainty and computer applications. Shah is the co-author of The Metrology Handbook. He participated in the development of ASQ’s Certified Calibration Technician (CCT) exam. He is the recipient of NCSLI’s 2011 Education and Training Award, MSC's 2010 Andrew J. Woodington Award, ASQ Measurement Quality Division’s 2005 Max J. Unis Award, and co-recipient of MSC’s 2003 Algie Lance Award for the Best Paper (gage R&R vs. ANOVA). Shah has served on the A2LA board of directors. He is a frequent contributor to the ASQ Quality Progress Measure for Measure column and ASQ Ask The Experts column. He is the past chair of the Measurement Quality Division.

Presentation(s):

Send Email for Dilip Shah

Michael Kirchner

Leidos

Presentation(s):

Send Email for Michael Kirchner


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W02 - ISO/IEC 17025:2017 New Requirements

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